Mehdi Tahoori

Mehdi B. Tahoori is Professor and Chair of Dependable Nano-Computing at Karlsruhe Institute of Technology (KIT), Germany, and a guest professor at imec, where he focuses on CMOS 2.0 and the future of chip design and manufacturing technologies. Previously, he worked at Xilinx Inc. and Fujitsu Laboratories in Silicon Valley and served as a junior professor at Northeastern University in Boston, MA. In 2015, he was a visiting professor at the VLSI Design and Education Center (VDEC) at the University of Tokyo, Japan. He received his B.S. in Computer Engineering from Sharif University of Technology, Tehran, Iran, in 2000, and his M.S. and Ph.D. in Electrical Engineering from Stanford University in 2002 and 2003, respectively. Currently, he is the deputy editor-in-chief of IEEE Design and Test Magazine and was the former editor-in-chief of Elsevier Microelectronic Reliability. He has served as the program and general chair of the IEEE VLSI Test Symposium (VTS) and the General Chair of the IEEE European Test Symposium (ETS). Prof. Tahoori is a recipient of the US National Science Foundation Early Faculty Development (CAREER) Award in 2008 and the European Research Council (ERC) Advanced Grant in 2022, along with multiple best paper nominations and awards at various conferences and journals. He is also the chair of the IEEE European Test Technologies Technical Council (eTTTC) and is a Fellow of the IEEE.